No. 711 Nanometer Micro Displacement Measurement System
It is a light interference measurement system capable of measuring minute changes on the order of nanometers in real time.
This is a new optical interference measurement system that uses the statistical characteristics of the scattering field (laser speckle) generated when a rough surface is illuminated with a laser, which is considered a standard in a statistical sense, and is not subject to limitations imposed by the precision of optical elements or the measurement targets. 【Product Features】 〇 Capable of sub-nanometer measurements 〇 Non-contact and non-invasive measurement 〇 Applicable to biological entities such as plant growth and changes in trees *For more details, please download the PDF or contact us.
- Company：東洋精機製作所
- Price：Other
